rus
Competent opinion
Column of radio-electronic industry department
Exhibitions & Conferences
Economy & Business
A. Fomina
Regional distribution and efficiency of Russian radio-electronic industry organizations The article presents the results of revised «Portrait of Russian Radio Electronics» study focused on regional distribution features and efficiency of organizations of Russian radio-electronic industry. To overcome regional imbalances in radio-electronic industry it is necessary to redirect
to more flexible development concepts particularly through the creation and improvement of design centers and project teams.
DOI: 10.22184/1992-4178.2019.185.4.140.143
УДК 311.42
ВАК 05.13.10
Regional distribution and efficiency of Russian radio-electronic industry organizations The article presents the results of revised «Portrait of Russian Radio Electronics» study focused on regional distribution features and efficiency of organizations of Russian radio-electronic industry. To overcome regional imbalances in radio-electronic industry it is necessary to redirect
to more flexible development concepts particularly through the creation and improvement of design centers and project teams.
DOI: 10.22184/1992-4178.2019.185.4.140.143
УДК 311.42
ВАК 05.13.10
Tags: efficiency number of employees structure of the radio-electronic industry структура радиоэлектронной промышленности численность сотрудников эффективность
Engineering solutions
S. Frolova, F. Putrya
Creation of multi-functional and multi-project prototyping platform based on Synopsys HAPS kit. Part 1 Prototyping stage is important in SoC design. The problems that many users face when debugging their projects could be solved by defining the debugging strategy and creating the necessary prototyping platform on its basis. The article describes the experience of NPC ELVIS JSC in developing such a platform based on Synopsys HAPS (High-performance ASIC Prototyping Systems) kit.
DOI: 10.22184/1992-4178.2019.185.4.76.81
УДК 658.512
ВАК 05.13.12
Creation of multi-functional and multi-project prototyping platform based on Synopsys HAPS kit. Part 1 Prototyping stage is important in SoC design. The problems that many users face when debugging their projects could be solved by defining the debugging strategy and creating the necessary prototyping platform on its basis. The article describes the experience of NPC ELVIS JSC in developing such a platform based on Synopsys HAPS (High-performance ASIC Prototyping Systems) kit.
DOI: 10.22184/1992-4178.2019.185.4.76.81
УДК 658.512
ВАК 05.13.12
Tags: debugging interface debugging strategy prototyping platform отладочный интерфейс платформа прототипирования стратегия отладки
CAD
S. Belousov
Enhancing FPGA-based device resistance to heavy ions using Synplify Premier The article discusses the use of majority redundancy in designs of devices particularly for space application based on different FPGA types in order to enhance their resistance to heavy ion impacts. It provides the implementation capabilities of this and other approaches for reliability
improvement using Synopsys Synplify Premier tool.
DOI: 10.22184/1992-4178.2019.185.4.82.87
УДК [004.9::658.512.22]::[004.31::629.78]
ВАК 05.13.12
Enhancing FPGA-based device resistance to heavy ions using Synplify Premier The article discusses the use of majority redundancy in designs of devices particularly for space application based on different FPGA types in order to enhance their resistance to heavy ion impacts. It provides the implementation capabilities of this and other approaches for reliability
improvement using Synopsys Synplify Premier tool.
DOI: 10.22184/1992-4178.2019.185.4.82.87
УДК [004.9::658.512.22]::[004.31::629.78]
ВАК 05.13.12
Tags: fpga heavy ion impact logic synthesis majority redundancy reliability space hardware synopsys аппаратура космического применения воздействие тяжелых заряженных частиц логический синтез мажоритарное резервирование надежность плис
M. Makushin, A. Fomina
Artificial intelligence and profitability as CAD development drivers The use of CAD tools is one of the key factors for ICs improvement and ensuring their further scaling. It is from them that the acceleration of launching new products to the market largely depends, due to the shortening of the development cycle. The main factors for CAD
development include profitability and artificial intelligence.
DOI: 10.22184/1992-4178.2019.184.4.90.100
УДК 658.512
ВАК 05.13.12
Artificial intelligence and profitability as CAD development drivers The use of CAD tools is one of the key factors for ICs improvement and ensuring their further scaling. It is from them that the acceleration of launching new products to the market largely depends, due to the shortening of the development cycle. The main factors for CAD
development include profitability and artificial intelligence.
DOI: 10.22184/1992-4178.2019.184.4.90.100
УДК 658.512
ВАК 05.13.12
Test & Measurements
V. Bykanov
Improving the regulatory framework in the field of metrological testing DOI: 10.22184/1992-4178.2019.185.4.102.106
Improving the regulatory framework in the field of metrological testing DOI: 10.22184/1992-4178.2019.185.4.102.106
S. Vedernikov
Metrological examination of technical documentation as one of the quality improvement stages In a market-based economy the products have to be distinguished by high quality indicators and the manufacturing process should be maximally optimized and effective for reducing economic costs.
DOI: 10.22184/1992-4178.2019.185.4.108.111
УДК 389.008.4
ВАК 05.11.15
Metrological examination of technical documentation as one of the quality improvement stages In a market-based economy the products have to be distinguished by high quality indicators and the manufacturing process should be maximally optimized and effective for reducing economic costs.
DOI: 10.22184/1992-4178.2019.185.4.108.111
УДК 389.008.4
ВАК 05.11.15
D. Kondrashov, A. Shostak, P. Dijkstra
Electromagnetic susceptibility tests – new solutions The article considers a number of effective solutions – field generators, field sensors and electromagnetic compatibility test systems – which allow testing the electromagnetic susceptibility of radioelectronic equipment in compliance with current requirements.
DOI: 10.22184/1992-4178.2019.184.4.112.117
УДК 621.317
ВАК 05.11.01
Electromagnetic susceptibility tests – new solutions The article considers a number of effective solutions – field generators, field sensors and electromagnetic compatibility test systems – which allow testing the electromagnetic susceptibility of radioelectronic equipment in compliance with current requirements.
DOI: 10.22184/1992-4178.2019.184.4.112.117
УДК 621.317
ВАК 05.11.01
Tags: electromagnetic compatibility field generator field strength sensor генератор поля датчик напряженности поля электромагнитная совместимость
Microwave electronics
V. Kochemasov, T. Kosichkina
Doherty power amplifiers. Part 2 The article describes Doherty power amplifiers and provides the information on the components for this amplifiers offered by various manufacturers.
DOI: 10.22184/1992-4178.2019.185.4.118.130
УДК 621.375
ВАК 05.27.01
Doherty power amplifiers. Part 2 The article describes Doherty power amplifiers and provides the information on the components for this amplifiers offered by various manufacturers.
DOI: 10.22184/1992-4178.2019.185.4.118.130
УДК 621.375
ВАК 05.27.01
Microprocessors and FPGAs
V. Ezhov
Microsemi SmartFusion2 SoC FPGA: the optimal solution for IoT The article describes the features of SmartFusion2 SoC FPGA family from Microsemi, which fully meets all the requirements for IoT infrastructure and allows you to create flexible systems featuring the minimum power consumption and the highest security level available for FPGAs.
Microsemi SmartFusion2 SoC FPGA: the optimal solution for IoT The article describes the features of SmartFusion2 SoC FPGA family from Microsemi, which fully meets all the requirements for IoT infrastructure and allows you to create flexible systems featuring the minimum power consumption and the highest security level available for FPGAs.
Tags: arm cortex-m3 data protection elliptic curve cryptography (ecc) embedded trace macrocell (etm) internet of things memory protection unit (mpu) smartfusion2 soc fpga встроенная макроячейка трассировки защита данных интернет вещей криптография на основе эллиптических кривых модуль защиты памяти снк на базе плис
A. Strogonov
Reliability characteristics of modern FPGAs The article describes the method for calculating the experimental FPGA failure rate using chi-square statistics, as well as the effect of failures caused by ionizing radiation on the reliability characteristics of modern FPGAs manufactured by nanometer design rules.
Reliability characteristics of modern FPGAs The article describes the method for calculating the experimental FPGA failure rate using chi-square statistics, as well as the effect of failures caused by ionizing radiation on the reliability characteristics of modern FPGAs manufactured by nanometer design rules.
Tags: chi-square statistics failure rate fpga single event functional interrupt (sefi) single event upset (seu) вызывающая функциональное прерывание (sefi) интенсивность отказов одиночная ошибка одиночный сбой (seu) плис статистика хи-квадрат
I. Tarasov
application of Xilinx Zynq SoC FPGA and design approaches based on high-level hardware description languages The article considers the capabilities of current and advanced SoC FPGA families from Xilinx as well as preferred approaches to the design of processor controlled digital systems based on the Xilinx Vivado HLS Design Suite.
DOI: 10.22184/1992-4178.2019.185.4.62.66
УДК 004.2
ВАК 05.13.15
application of Xilinx Zynq SoC FPGA and design approaches based on high-level hardware description languages The article considers the capabilities of current and advanced SoC FPGA families from Xilinx as well as preferred approaches to the design of processor controlled digital systems based on the Xilinx Vivado HLS Design Suite.
DOI: 10.22184/1992-4178.2019.185.4.62.66
УДК 004.2
ВАК 05.13.15
L. Di Jasio
How to synthesize a new function using PIC microcontroller’s core independent peripherals Pinout rearrangement and core independent peripherals of PIC microcontrollers allow the developer to flexibly modify the design solution. Using the example of PWM function the article shows how you can quickly synthesize a new autonomous peripheral function without additional external components and the need to change PCB layout.
DOI: 10.22184/1992-4178.2019.185.4.68.72
УДК 621.3.049.774
ВАК 05.27.01
How to synthesize a new function using PIC microcontroller’s core independent peripherals Pinout rearrangement and core independent peripherals of PIC microcontrollers allow the developer to flexibly modify the design solution. Using the example of PWM function the article shows how you can quickly synthesize a new autonomous peripheral function without additional external components and the need to change PCB layout.
DOI: 10.22184/1992-4178.2019.185.4.68.72
УДК 621.3.049.774
ВАК 05.27.01
Tags: core independent peripherals (cip) peripheral pin select (pps) pic microcontroller pinout pwm function выбор вывода периферии микроконтроллер pic независимая от ядра периферия цоколевка выводов шим-функция
Production technologies
P. Grigoriev, S. Mileshin, T. Tsivinskaya
Investigation of SIEL compound PRO TECTION EFFECT on the operation stability of control and measuring MEMS sensors The article discuses one of the issues of development and production of measuring sensors based on highly sensitive element manufactured using microelectronics technology: environmental protection of MEMS sensors based on single-crystal silicon. It presents the results of the research in the field of piezoresistive sensors carried out by Bauman Moscow State Technical University.
DOI: 10.22184/1992-4178.2019.185.4.132.138
УДК 681.586
ВАК 05.11.14
Investigation of SIEL compound PRO TECTION EFFECT on the operation stability of control and measuring MEMS sensors The article discuses one of the issues of development and production of measuring sensors based on highly sensitive element manufactured using microelectronics technology: environmental protection of MEMS sensors based on single-crystal silicon. It presents the results of the research in the field of piezoresistive sensors carried out by Bauman Moscow State Technical University.
DOI: 10.22184/1992-4178.2019.185.4.132.138
УДК 681.586
ВАК 05.11.14