rus
Competent opinion
A. Kishchinsky
We see that we can speak with foreign companies on equal terms DOI: 10.22184/1992-4178.2019.190.9.10.16
We see that we can speak with foreign companies on equal terms DOI: 10.22184/1992-4178.2019.190.9.10.16
Column of radio-electronic industry department
Report from a company
Yu. Kovalevsky, O. Salikova
It's time to move to Russian technology. Especially when there is one DOI: 10.22184/1992-4178.2019.190.9.44.52
Visit to St. Petersburg’s Center ELMA LLC
It's time to move to Russian technology. Especially when there is one DOI: 10.22184/1992-4178.2019.190.9.44.52
Visit to St. Petersburg’s Center ELMA LLC
Yu. Kovalevsky
Flexibility or productivity of contract manufacturing: is the dilemma solvable? DOI: 10.22184/1992-4178.2019.190.9.54.63
Visit to Nanotech LLC assembly site
Flexibility or productivity of contract manufacturing: is the dilemma solvable? DOI: 10.22184/1992-4178.2019.190.9.54.63
Visit to Nanotech LLC assembly site
Exhibitions & Conferences
Yu. Kovalevsky
Conference "State support of export activities of radio-electronic industry enterprises" DOI: 10.22184/1992-4178.2019.190.9.36.39
Conference "State support of export activities of radio-electronic industry enterprises" DOI: 10.22184/1992-4178.2019.190.9.36.39
V. Meylitsev
Microelectronic Assembly and Packaging Technologies DOI: 10.22184/1992-4178.2019.190.9.42.43
III annual technology conference “Technologies of
microelectronic assembly and packaging” by Global
Engineering GC
Microelectronic Assembly and Packaging Technologies DOI: 10.22184/1992-4178.2019.190.9.42.43
III annual technology conference “Technologies of
microelectronic assembly and packaging” by Global
Engineering GC
NEWS
Manufacturing equipment and process materials
A. Zavalko
Universal assembly centers: how to accelerate the market launch of complex and unique products DOI: 10.22184/1992-4178.2019.190.9.66.69
Universal assembly centers: how to accelerate the market launch of complex and unique products DOI: 10.22184/1992-4178.2019.190.9.66.69
M. Makushin, V. Martynov
Mastering EUV lithography in serial production: prospects and problems DOI: 10.22184/1992-4178.2019.190.9.70.79
Mastering EUV lithography in serial production: prospects and problems DOI: 10.22184/1992-4178.2019.190.9.70.79
S. Avakov, V. Plebanovich, A. Lapko
Image generators for maskless lithography DOI: 10.22184/1992-4178.2019.190.9.80.84
Image generators for maskless lithography DOI: 10.22184/1992-4178.2019.190.9.80.84
D. Potseluev
Water-proof coating: what to consider when choosing one DOI: 10.22184/1992-4178.2019.190.9.86.88
Water-proof coating: what to consider when choosing one DOI: 10.22184/1992-4178.2019.190.9.86.88
Test & Measurements
N. Lemeshko, P. Strunin
Time domain simulation of linear Hall sensors and experimental identification of their models parameters using Rohde & Schwarz equipment DOI: 10.22184/1992-4178.2019.190.9.104.113
Time domain simulation of linear Hall sensors and experimental identification of their models parameters using Rohde & Schwarz equipment DOI: 10.22184/1992-4178.2019.190.9.104.113
Micromodules and microassemblies
A. Shcherbina
Development and manufacture of microassemblies based on multilayer ceramics DOI: 10.22184/1992-4178.2019.190.9.90.93
Development and manufacture of microassemblies based on multilayer ceramics DOI: 10.22184/1992-4178.2019.190.9.90.93
Microwave electronics
V. Kochemasov, S. Dinges, V. Shadsky
Medium and High Power microwave Solid-State Switches. Part 2 DOI: 10.22184/1992-4178.2019.190.9.116.130
Medium and High Power microwave Solid-State Switches. Part 2 DOI: 10.22184/1992-4178.2019.190.9.116.130
Reliability and tests
A. Herbin
The use of accelerated methods for assessing the reliability indicators of domestic electronic components is one of the ways to increase their commercial attractiveness DOI: 10.22184/1992-4178.2019.190.9.136.140
The use of accelerated methods for assessing the reliability indicators of domestic electronic components is one of the ways to increase their commercial attractiveness DOI: 10.22184/1992-4178.2019.190.9.136.140
E. Fyodorov
Shielded and anechoic chambers for confidential information protection and EMC testing DOI: 10.22184/1992-4178.2019.190.9.142.147
Shielded and anechoic chambers for confidential information protection and EMC testing DOI: 10.22184/1992-4178.2019.190.9.142.147
Digital manufacturing
R. Romashko, V. Ezhov
HARTING digital technology for modern production: when a customer becomes a partner DOI: 10.22184/1992-4178.2019.190.9.132.135
HARTING digital technology for modern production: when a customer becomes a partner DOI: 10.22184/1992-4178.2019.190.9.132.135
Production technologies
M. Grigoriev, T. Mikhailova, T. Myasoedova
Development of electrochemical capacitor electrodes based on silicon-carbon structures DOI: 10.22184/1992-4178.2019.190.9.96.102
Development of electrochemical capacitor electrodes based on silicon-carbon structures DOI: 10.22184/1992-4178.2019.190.9.96.102