rus
Competent opinion
M. Gurbashkov
THE MARKET NEEDS DOMESTIC LINE OF UNIFIED DRIVE SOLUTIONS WITH HIGH LEVEL OF DELIVERY READINESS DOI: 10.22184/1992-4178.2023.223.2.12.18
THE MARKET NEEDS DOMESTIC LINE OF UNIFIED DRIVE SOLUTIONS WITH HIGH LEVEL OF DELIVERY READINESS DOI: 10.22184/1992-4178.2023.223.2.12.18
Exhibitions & Conferences
R. Mangusheva
EXPOELECTRONICA 2023 INTERNATIONAL ANNIVERSARY EXHIBITION – NEW SECTIONS, NEW OPPORTUNITIES FOR EXHIBITORS AND VISITORS DOI: 10.22184/1992-4178.2023.223.2.28.30
The article presents the results of the ExpoElectronica 2022 exhibition and discusses the planned significant changes in the organization of the ExpoElectronica 2023 exhibition.
EXPOELECTRONICA 2023 INTERNATIONAL ANNIVERSARY EXHIBITION – NEW SECTIONS, NEW OPPORTUNITIES FOR EXHIBITORS AND VISITORS DOI: 10.22184/1992-4178.2023.223.2.28.30
The article presents the results of the ExpoElectronica 2022 exhibition and discusses the planned significant changes in the organization of the ExpoElectronica 2023 exhibition.
Tags: business program cooperation exhibition interregional and international links updated exposition выставка деловая программа межрегиональные и международные связи обновленная экспозиция сотрудничество
NEWS
Economy & Business
N. Shelepin
GLOBALIZATION AND MONOPOLIZATION OF MICROELECTRONICS IN CURRENT CONDITIONS DOI: 10.22184/1992-4178.2023.223.2.32.42
The article considers the current state of semiconductor production in the world, trends and prospects for the development of microelectronic technologies in various regions. The unprecedented efforts of the United States to return the leading microelectronic industries to its territory and measures to counteract the development of technologies in China are described.
GLOBALIZATION AND MONOPOLIZATION OF MICROELECTRONICS IN CURRENT CONDITIONS DOI: 10.22184/1992-4178.2023.223.2.32.42
The article considers the current state of semiconductor production in the world, trends and prospects for the development of microelectronic technologies in various regions. The unprecedented efforts of the United States to return the leading microelectronic industries to its territory and measures to counteract the development of technologies in China are described.
Tags: business model contract manufacturing companies fabless companies fabless-компании globalization microelectronic production monopolization бизнес-модель глобализация компании контрактного производства микроэлектронное производство монополизация
B. Avdonin, M. Makushin
CHIPS ACT AND SOME ASPECTS OF IMPROVING THE US R & D ECOSYSTEM DOI: 10.22184/1992-4178.2023.223.2.44.52
As part of the struggle to maintain world dominance, the United States pays great attention to stimulating the development of the semiconductor industry (and, above all, microelectronics) as the basis for the development of the radioelectronic complex branches and the modernization of the economy as a whole at a new technological level. An important aspect of this efforts is the improvement of the microelectronics R&D ecosystem.
CHIPS ACT AND SOME ASPECTS OF IMPROVING THE US R & D ECOSYSTEM DOI: 10.22184/1992-4178.2023.223.2.44.52
As part of the struggle to maintain world dominance, the United States pays great attention to stimulating the development of the semiconductor industry (and, above all, microelectronics) as the basis for the development of the radioelectronic complex branches and the modernization of the economy as a whole at a new technological level. An important aspect of this efforts is the improvement of the microelectronics R&D ecosystem.
Information and telecommunication systems
E. Starovoitov, E. Skiba
NAVIGATION IN THE CITY BY STATIONARY RADIO SOURCES DOI: 10.22184/1992-4178.2023.223.2.134.139
The article evaluates the possibilities of detecting radio sources with constant coordinates in the city by a radio scanner developed by NIIMA Progress JSC and designed for navigating unmanned vehicles in the absence of information from other sensors.
NAVIGATION IN THE CITY BY STATIONARY RADIO SOURCES DOI: 10.22184/1992-4178.2023.223.2.134.139
The article evaluates the possibilities of detecting radio sources with constant coordinates in the city by a radio scanner developed by NIIMA Progress JSC and designed for navigating unmanned vehicles in the absence of information from other sensors.
Tags: consul system local navigation system radio scanner локальная система навигации радиосканер система «консул»
Manufacturing equipment and process materials
I. Petukhov, E. Letunovich
BENCH-TOP AUTOMATIC MACHINE FOR GOLD WIRE MOUNTING BY BALL-WEDGE METHOD DOI: 10.22184/1992-4178.2023.223.2.54.59
The article describes the bench-top automatic machine for thermosonic micro welding gold wire leads with a diameter of 17.5 to 50 µm featured an automatic system for the alignment of working tool with multi-level pads and a precision three-axis coordinate system based on servo drives. The machine provides automatic leads mounting according to the coordinates of the interconnection points previously stored in the memory.
BENCH-TOP AUTOMATIC MACHINE FOR GOLD WIRE MOUNTING BY BALL-WEDGE METHOD DOI: 10.22184/1992-4178.2023.223.2.54.59
The article describes the bench-top automatic machine for thermosonic micro welding gold wire leads with a diameter of 17.5 to 50 µm featured an automatic system for the alignment of working tool with multi-level pads and a precision three-axis coordinate system based on servo drives. The machine provides automatic leads mounting according to the coordinates of the interconnection points previously stored in the memory.
Tags: 2.5d architecture 5d automatic machine interconnection mounting multichip modules multi-level contact pads thermosonic micro welding автоматическая установка архитектура 2 многокристальные модули монтаж межсоединений разноуровневые контактные площадки термозвуковая микросварка
Electronic Components
R. Alekseev, I. Semeykin, A. Tsotsorin, P. Kurshev
LDMOS: THE NEW PRODUCTS BY NIIET JSC DOI: 10.22184/1992-4178.2023.223.2.92.96
The article provides information about LDMOS process improvements at NIIET JSC, as well as about new microwave transistors under development by the company which are based on this technology and designed for DVB-T / DVB-T2 TV equipment.
LDMOS: THE NEW PRODUCTS BY NIIET JSC DOI: 10.22184/1992-4178.2023.223.2.92.96
The article provides information about LDMOS process improvements at NIIET JSC, as well as about new microwave transistors under development by the company which are based on this technology and designed for DVB-T / DVB-T2 TV equipment.
Tags: dvb-t / dvb-t2 electronic components ldmos microwave transistor transistor die компонентная база свч-транзистор стандарты dvb-t / dvb-t2 технология ldmos транзисторный кристалл
M. Korotkov
NEW FROM THINKING ELECTRONIC: KRV SERIES COMBINED OVERVOLTAGE AND OVERCURRENT PROTECTION DEVICES DOI: 10.22184/1992-4178.2023.223.2.98.100
The Taiwanese company Thinking Electronic Industrial offers a wide range of components for protecting circuits from excessive voltage, current and temperature. The article discusses the features and advantages of KRV series combined protection devices.
NEW FROM THINKING ELECTRONIC: KRV SERIES COMBINED OVERVOLTAGE AND OVERCURRENT PROTECTION DEVICES DOI: 10.22184/1992-4178.2023.223.2.98.100
The Taiwanese company Thinking Electronic Industrial offers a wide range of components for protecting circuits from excessive voltage, current and temperature. The article discusses the features and advantages of KRV series combined protection devices.
Tags: metal-oxide varistor (mov) ntc thermistor ntc-термистор overcurrent and overtemperature protection devices overvoltage polymer ptc resettable fuse (pptc) ptc thermistor ptc-термистор металлооксидный варистор (mov) полимерный самовосстанавливающийся предохранитель с положительны тока и температуры устройства защиты от избыточного напряжения
Test & Measurements
E. Epifantsev
ALGORITHM FOR INTRODUCING COMPENSATION COEFFICIENTS AT OUT-OF-ROUND GAGE DOI: 10.22184/1992-4178.2023.223.2.144.149
In the process of preparing the out-of-round gage for operation, it is necessary to calibrate it, which consists in leveling the table and introducing a compensation pressure coefficient.
ALGORITHM FOR INTRODUCING COMPENSATION COEFFICIENTS AT OUT-OF-ROUND GAGE DOI: 10.22184/1992-4178.2023.223.2.144.149
In the process of preparing the out-of-round gage for operation, it is necessary to calibrate it, which consists in leveling the table and introducing a compensation pressure coefficient.
Tags: device centering method of installing weights out-of-round gage кругломер методика установки грузов центрирование прибора
K. Epifantsev
INVESTIGATION OF THE OPERATION ALGORITHM OF THE OUT-OF-ROUND GAGE CENTERING SYSTEM DOI: 10.22184/1992-4178.2023.223.2.150.156
The analysis of correlations in the compensation system of the out-of-round gage (Spearman correlation analysis) was carried out, correlation graphs were constructed that reflect the dependences of the centering value, compensation coefficients on the mass of weights in the out-of-round gage software module.
INVESTIGATION OF THE OPERATION ALGORITHM OF THE OUT-OF-ROUND GAGE CENTERING SYSTEM DOI: 10.22184/1992-4178.2023.223.2.150.156
The analysis of correlations in the compensation system of the out-of-round gage (Spearman correlation analysis) was carried out, correlation graphs were constructed that reflect the dependences of the centering value, compensation coefficients on the mass of weights in the out-of-round gage software module.
Tags: alignment centering correlation graphs spearman correlation analysis выравнивание корреляционные графы корреляционный анализ спирмена центрирование
Microwave electronics
D. Sadekov
OVERVIEW OF SIT PRODUCTS DOI: 10.22184/1992-4178.2023.223.2.102.108
The Chinese company Silicon Internet of Things Technology (SIT) specializes in the production of interface chips for automotive and industrial applications. The article provides an overview of the main categories and series of products manufactured by SIT, their key applications.
OVERVIEW OF SIT PRODUCTS DOI: 10.22184/1992-4178.2023.223.2.102.108
The Chinese company Silicon Internet of Things Technology (SIT) specializes in the production of interface chips for automotive and industrial applications. The article provides an overview of the main categories and series of products manufactured by SIT, their key applications.
Tags: can / can fd diode protection devices interface chips lin rs 232 rs 422 / rs 485 transceiver диодные устройства защиты интерфейсные микросхемы трансивер
K. Djurinsky
HISTORY OF RF CONNECTORS. GENERAL PURPOSE CONNECTORS. Part 2 DOI: 10.22184/1992-4178.2023.223.2.112.118
The main directions in the development of radio frequency connectors are advancement to higher frequency range, miniaturization, reliability improvement, anchacement of the main parameters. The article considers the following mm-band connectors: 2.4 mm (50 GHz limiting frequency), 1.85 mm (65 GHz), 1.0 mm (110 GHz), 1.35 mm (90 GHz), 0.8 mm (145 GHz).
HISTORY OF RF CONNECTORS. GENERAL PURPOSE CONNECTORS. Part 2 DOI: 10.22184/1992-4178.2023.223.2.112.118
The main directions in the development of radio frequency connectors are advancement to higher frequency range, miniaturization, reliability improvement, anchacement of the main parameters. The article considers the following mm-band connectors: 2.4 mm (50 GHz limiting frequency), 1.85 mm (65 GHz), 1.0 mm (110 GHz), 1.35 mm (90 GHz), 0.8 mm (145 GHz).
Tags: mm-band connectors mobile and cellular connectors соединители для мобильной и сотовой связи соединители мм-диапазона
V. Kochemasov, A. Safin, S. Dinges
ANTENNA SWITCHES. PART 6 DOI: 10.22184/1992-4178.2023.223.2.120.133
The article considers the antenna switches. Information is provided on the features and characteristics of various types of such devices produced by a number of manufacturers.
ANTENNA SWITCHES. PART 6 DOI: 10.22184/1992-4178.2023.223.2.120.133
The article considers the antenna switches. Information is provided on the features and characteristics of various types of such devices produced by a number of manufacturers.
Reliability and tests
E. Shekhovtsova
TESTPRIBOR JSC TEST CENTER: HOW TO GUARANTEE RELIABILITY DOI: 10.22184/1992-4178.2023.223.2.140.141
One of the key directions of development of TESTPRIBOR JSC is the expansion of the works carried out at the test center. The article presents the company's capabilities in terms of certification, qualification, acceptance, periodic and other types of tests.
TESTPRIBOR JSC TEST CENTER: HOW TO GUARANTEE RELIABILITY DOI: 10.22184/1992-4178.2023.223.2.140.141
One of the key directions of development of TESTPRIBOR JSC is the expansion of the works carried out at the test center. The article presents the company's capabilities in terms of certification, qualification, acceptance, periodic and other types of tests.
Tags: acceptance certification emc laboratory periodic tests qualification test laboratory испытательная лаборатория квалификационные лаборатория эмс периодические испытания приемо-сдаточные сертификационные
for Engineers
Production technologies
A. Vidritsky, V. Lanin
MICROBOLOMETERS VACUUM PACKAGING DOI: 10.22184/1992-4178.2023.223.2.60.66
The article describes the development of the microbolometer packaging technology. Packaging is carried out at high vacuum using a getter, which ensures that the specified vacuum level is maintained inside the package of micromechanical device during the period of storage and operation.
MICROBOLOMETERS VACUUM PACKAGING DOI: 10.22184/1992-4178.2023.223.2.60.66
The article describes the development of the microbolometer packaging technology. Packaging is carried out at high vacuum using a getter, which ensures that the specified vacuum level is maintained inside the package of micromechanical device during the period of storage and operation.
Tags: вакуумная герметизация вакуумплотный корпус геттер микроболометры пайка с преформой подкорпусное давление
E. Pankratova, Sh. Shugaepov, E. Ermolaev, V. Egoshin
THE USE OF PHOTOLITHOGRAPHY FOR THE MANUFACTURE OF METAL COMPONENTS AT ZPP JSC DOI: 10.22184/1992-4178.2023.223.2.68.70
The article considers the use of photolithography at Plant of Semiconductor Devices JSC (ZPP JSC) for the manufacture of various metal components. Examples of products manufactured using this technology are given.
THE USE OF PHOTOLITHOGRAPHY FOR THE MANUFACTURE OF METAL COMPONENTS AT ZPP JSC DOI: 10.22184/1992-4178.2023.223.2.68.70
The article considers the use of photolithography at Plant of Semiconductor Devices JSC (ZPP JSC) for the manufacture of various metal components. Examples of products manufactured using this technology are given.
O. Pochtar, A. Pochtar
STABILITY AND REPRODUCIBILITY EVALUATION OF THE TECHNOLOGICAL PROCESS OF METALLIZATION THROUGH A REMOVABLE MASK DOI: 10.22184/1992-4178.2023.223.2.72.76
Based on statistical processing of experimental data, the article presents the stability and reproducibility evaluation of the technological process of two-layer metallization of lithium niobate crystals through a metal removable mask by electron beam evaporation.
STABILITY AND REPRODUCIBILITY EVALUATION OF THE TECHNOLOGICAL PROCESS OF METALLIZATION THROUGH A REMOVABLE MASK DOI: 10.22184/1992-4178.2023.223.2.72.76
Based on statistical processing of experimental data, the article presents the stability and reproducibility evaluation of the technological process of two-layer metallization of lithium niobate crystals through a metal removable mask by electron beam evaporation.
Tags: electron beam evaporation process stability and reproducibility shewhart control charts statistical process control two-layer crystal metallization двухслойная металлизация кристаллов контрольные карты шухарта стабильность и воспроизводимость технологического процесса статистический контроль технологических процессов электронно-лучевое испарение
Micro and nanostructures
A. Novak, A. Sokolov, V. Kovalev
CHARACTERISTICS OF SILICON CANTILEVERS FOR ATOMIC FORCE MICROSCOPY FROM ANGSTREM JSC DOI: 10.22184/1992-4178.2023.223.2.78.86
The article presents the results of measuring the main parameters of silicon cantilevers manufactured by Angstrem JSC, designed for operation in the semi-contact and contact modes of atomic force microscopy (AFM), as well as AFM images of various samples obtained using these cantilevers.
CHARACTERISTICS OF SILICON CANTILEVERS FOR ATOMIC FORCE MICROSCOPY FROM ANGSTREM JSC DOI: 10.22184/1992-4178.2023.223.2.78.86
The article presents the results of measuring the main parameters of silicon cantilevers manufactured by Angstrem JSC, designed for operation in the semi-contact and contact modes of atomic force microscopy (AFM), as well as AFM images of various samples obtained using these cantilevers.
Tags: atomic force microscopy cantilever console needle атомно-силовая микроскопия игла кантилевер консоль
A. Makharinets, L. Mileshko
ELECTROLYTIC ANODIZING OF SILICON, SILICON CARBIDE AND SILICON NITRIDE FOR NANOTECHNOLOGY PURPOSES (REVIEW) DOI: 10.22184/1992-4178.2023.223.2.88.90
The article presents the analysis of technologies for the formation of nanometer anodic oxide films by the method of electrolytic anodization of silicon, silicon carbide and silicon nitride. Examples of the use of such technologies in micro- and nanoelectronics are given.
ELECTROLYTIC ANODIZING OF SILICON, SILICON CARBIDE AND SILICON NITRIDE FOR NANOTECHNOLOGY PURPOSES (REVIEW) DOI: 10.22184/1992-4178.2023.223.2.88.90
The article presents the analysis of technologies for the formation of nanometer anodic oxide films by the method of electrolytic anodization of silicon, silicon carbide and silicon nitride. Examples of the use of such technologies in micro- and nanoelectronics are given.