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DOI: 10.22184/1992-4178.2024.233.2.88.96
The article discusses the main methodological approaches adopted in foreign and domestic engineering schools in the field of predicting the durability of integrated circuits based on parametric failures.
The article discusses the main methodological approaches adopted in foreign and domestic engineering schools in the field of predicting the durability of integrated circuits based on parametric failures.
Теги: aging effects degradation durability parametric failures prediction reliability деградация долговечность надежность параметрические отказы прогнозирование эффекты старения
METHODS FOR PREDICTING IC DURABILITY BASED ON PARAMETRIC FAILURES
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