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DOI: 10.22184/1992-4178.2024.233.2.88.96
The article discusses the main methodological approaches adopted in foreign and domestic engineering schools in the field of predicting the durability of integrated circuits based on parametric failures.
Tags: aging effects degradation durability parametric failures prediction reliability деградация долговечность надежность параметрические отказы прогнозирование эффекты старения
Subscribe to the journal Electronics: STB to read the full article.
The article discusses the main methodological approaches adopted in foreign and domestic engineering schools in the field of predicting the durability of integrated circuits based on parametric failures.
Tags: aging effects degradation durability parametric failures prediction reliability деградация долговечность надежность параметрические отказы прогнозирование эффекты старения
Subscribe to the journal Electronics: STB to read the full article.
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