rus
Issue #3/2024
I. Rozhkov, A. Garanin, D. Podolsky
CHASING EXCELLENCE: FROM DEEP MACHINE LEARNING TO ARTIFICIAL INTELLIGENCE IN MAKER-RAY AOI SYSTEMS. PART 2
CHASING EXCELLENCE: FROM DEEP MACHINE LEARNING TO ARTIFICIAL INTELLIGENCE IN MAKER-RAY AOI SYSTEMS. PART 2
DOI: 10.22184/1992-4178.2024.234.3.200.206
In the first part of the article, published in «ELECTRONICS: Science, Technology, Business» No. 10/2023 journal, the effectiveness of the use of artificial intelligence (AI) was substantiated as the next step in the development of machine learning algorithms in image analysis. The second part discusses the theory and practice of building a virtual model for the operation of artificial intelligence used in Maker-Ray optical inspection systems.
In the first part of the article, published in «ELECTRONICS: Science, Technology, Business» No. 10/2023 journal, the effectiveness of the use of artificial intelligence (AI) was substantiated as the next step in the development of machine learning algorithms in image analysis. The second part discusses the theory and practice of building a virtual model for the operation of artificial intelligence used in Maker-Ray optical inspection systems.
Теги: automatic optical inspection (aoi) component classification deep machine learning image augmentation image cropping автоматическая оптическая инспекция (аои) глубокое машинное обучение классификация компонентов обрезка изображения повышение информативности изображений
CHASING EXCELLENCE: FROM DEEP MACHINE LEARNING TO ARTIFICIAL INTELLIGENCE IN MAKER-RAY AOI SYSTEMS. PART 2
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