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Issue #9/2021
Yu. Kovalevsky
TESTING OF ELECTRONIC ASSEMBLIES: FRESH AND UNCOMMON THINGS JTAG TECHNOLOGIES BOUNDARY SCAN AND SPEA IN-CIRCUIT TESTING SYSTEMS USER CONFERENCE
TESTING OF ELECTRONIC ASSEMBLIES: FRESH AND UNCOMMON THINGS JTAG TECHNOLOGIES BOUNDARY SCAN AND SPEA IN-CIRCUIT TESTING SYSTEMS USER CONFERENCE
DOI: 10.22184/1992-4178.2021.210.9.48.50
TESTING OF ELECTRONIC ASSEMBLIES: FRESH AND UNCOMMON THINGS JTAG TECHNOLOGIES BOUNDARY SCAN AND SPEA IN-CIRCUIT TESTING SYSTEMS USER CONFERENCE
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