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DOI: 10.22184/1992-4178.2021.210.9.94.98
The article considers the use of boundary scan for the inspection test of Xilinx Virtex-7 chips. It is noted that the presented solutions can be used at the enterprises of the radio-electronic industry to carry out the incoming verification procedure.
The article considers the use of boundary scan for the inspection test of Xilinx Virtex-7 chips. It is noted that the presented solutions can be used at the enterprises of the radio-electronic industry to carry out the incoming verification procedure.
XILINX VIRTEX-7 CHIPS INSPECTION TEST USING BOUNDARY SCAN
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